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Conference

The 28th IEEE Semiconductor Interface Specialists Conference (SISC)

Country

USA

Date

1997

Research Title

Current density dependence of trap generation in the gate oxide of n-MOSFETs during low field substrate hot electron injection

Authors

I. S. Al-Kofahi, S. Taylor and C. Beech

Nature of contribution

presenting a paper

Attachments

Created at 3/14/2013 12:29 AM by Dr. Idrees Solaiman Al-Kofahi
Last modified at 3/14/2013 12:29 AM by Dr. Idrees Solaiman Al-Kofahi