Skip Ribbon Commands
Skip to main content
   YU Faculty Websites>>  Dr. Idrees S. Al-Kofahi Sign In

Conference

IEEE International Reliability Physics Proceedings, 34th annual

Country

USA

Date

1996

Research Title

On the hot hole induced post-stress interface trap generation in MOSFET’s

Authors

I. S. Al-Kofahi, J. F. Zhang and G. Groeseneken

Nature of contribution

presenting a paper

Attachments

Created at 3/14/2013 12:33 AM by Dr. Idrees Solaiman Al-Kofahi
Last modified at 8/9/2015 11:45 PM by Dr. Idrees Solaiman Al-Kofahi